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Mr. Jiaxing Dong (Master Thesis Student)
This person worked in the group from 2017 till 2018.
| Affiliation: | Ghent University - IMEC
Information Technology | | E-mail: | [email protected] | | Research Area: | Variability modeling and yield analysis |
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Specific Research Topics
Publications (5)International Journals
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Y. Xing, J. Dong, U. Khan, W. Bogaerts,
Capturing the effects of spatial process variations in silicon photonic circuits, ACS Photonics, doi:10.1021/acsphotonics.2c01194 (2022)
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Y. Xing, J. Dong, U. Khan, W. Bogaerts,
Correlation between Pattern Density and Linewidth Variation in Silicon Photonics Waveguides, Optics Express, 28(6), p.7961-7968 doi:10.1364/OE.388149 (2020) .
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Y. Xing, J. Dong, S. Dwivedi, U. Khan, W. Bogaerts,
Accurate Extraction of Fabricated Geometry Using Optical Measurement, Photonics Research, 6 (11), p.1008-1020 doi:10.1364/PRJ.6.001008 (2018) .
International Conferences
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W. Bogaerts, Y. Xing, Y. Ye, U. Khan, J. Dong, J. Geessels, M. Fiers, D. Spina, T. Dhaene,
Predicting Yield of Photonic Circuits With Wafer-scale Fabrication Variability, 2019 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO) (invited), United States, p.1-3 doi:10.1109/NEMO.2019.8853660 (2019) .
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Y. Xing, J. Dong, U. Khan, Y. Ye, D. Spina, T. Dhaene, W. Bogaerts,
From Parameter Extraction, Variability Models to Yield_Prediction, Latin America Optics & Photonics Conference (invited), Peru, p.paper W3E.1 (3 pages) doi:10.1364/LAOP.2018.W3E.1 (2018) .
Click here for a printable publication list.
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