| Authors: | M. Zenari, M. Buffolo, C. De Santi, J. Goyvaerts, A. Grabowski, J. Gustavsson, S. Kumari, A. Stassren, R. Baets, A. Larsson, G. Roelkens, G. Meneghesso, E. Zanoni, M. Meneghini | | Title: | Modeling the electrical degradation of micro-transfer printed 845nm VCSILs for silicon photonics | | Format: | International Journal | | Publication date: | 1/2023 | | Journal/Conference/Book: | Transactions on Electron Devices
| | Volume(Issue): | 71(2) p.1131-1138 | | DOI: | 10.1109/TED.2023.3346370 | | Citations: | 1 (Dimensions.ai - last update: 24/11/2024)
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