| Authors: | A. Yimam, D. Colucci, C. Caer, D. Yudistiri, Y. De Koninck, H. Sar, M. Barishnikova, P. Verheyen, J. Van Campenhout, B. Kunert, G. Morthier, D. Van Thourhout | | Title: | Extraction of Recombination Coefficients for Electrically Injected InGaAs/GaAs Monolithic Nano-ridge Laser Diodes Integrated on Silicon | | Format: | International Conference Poster | | Publication date: | 4/2025 | | Journal/Conference/Book: | IEEE Silicon Photonics Conference
| | Editor/Publisher: | IEEE , | | Location: | London, United Kingdom | | Citations: | Look up on Google Scholar
| | Download: |
 (1.7MB) |
Abstract
We present the extraction of recombination coefficients
for electrically injected monolithic nano-ridge laser diodes
by first determining the effective carrier capture time from the
small signal modulation response. The effect of the nano-ridge
box size on the recombination coefficients is investigated. Related Research Topics
Related Projects
|
|
