| Authors: | A. Ruocco, W. Bogaerts | | Title: | Fully Integrated SOI Wavelength Meter Based on Phase Shift Technique | | Format: | International Conference Proceedings | | Publication date: | 8/2015 | | Journal/Conference/Book: | 12th International Conference on Group IV Photonics (GFP)
| | Volume(Issue): | p.WP48 | | Location: | Vancouver, Canada | | DOI: | 10.1109/group4.2015.7305985 | | Citations: | 10 (Dimensions.ai - last update: 24/11/2024)
5 (OpenCitations - last update: 27/6/2024)
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Abstract
We present an MZI (Mach-Zehnder Interferometer) silicon-on-insulator (SOI) wavelength meter. The device integrates photo detectors and modulators. The phase shift between carrier and modulated signal is linearly correlated to the input wavelength. Related Research Topics
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