| Authors: | G. Morthier, P. Verhoeve, R. Baets, R. Schatz | | Title: | Extraction of a large set of laser parameters from different measurements | | Format: | International Conference Proceedings | | Publication date: | 10/1996 | | Journal/Conference/Book: | Proc. of the 15th IEEE Int. Semiconductor Laser Conf.
| | Volume(Issue): | p.175-176 | | Location: | Haifa, Israel | | Internal Reference: | [O-514] | | DOI: | 10.1109/islc.1996.558796 | | Citations: | 1 (Dimensions.ai - last update: 24/11/2024)
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